Minutes, IBIS Quality Committee

01 Apr 2008

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
* David Banas, Xilinx
  Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
* Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lynne Green
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for patent disclosure:

- No one declared a patent.

AR Review:

AR: Mike invite Walter Katz to talk about measurements BIRDs
- TBD

New items:

- Mike: please send emails feedback on JEITA response document

- Lance spoke with Anders Eckholm.
  - Would like to discuss golden waveform proposal

- Anders:
  - oshoot/ushoot for function and destruction
  - requires 2 values

AR: Mike add Anders Ekholm to ibis-quality email list

Presentation by Guan Tao "Measurement Correlation":
- Suggestions for correlation of IBIS to source data
- Correlation procedure is specified in IBIS Accuracy Handbook.
- Golden waveforms are not required for this method.
- It is difficult for IBIS users to correlate, model makers should do it.
- Huawei procedure:
  - Compare measurements on real boards (not test boards) with IBIS
  - Choose net with low crosstalk and ground bounce
  - Probe near receiver pin
  - Produce an internal report
- David: complex test fixture may introduce interconnect characterization error
- Mike: Need to simulate with probe parasitics for good match
- Lance: Often see a difference when simulating with interconnect
- Moshiul: How good is the correlation?
  - Guan: IBIS correlation is good
- Mike: How do we know where the board falls with regard to FTS?
  - Guan: it should fall somewhere between the F and S corners
  - Only need to check that it is within limits
- David: Are we assuming the receiver model is accurate?
  - Guan: The receiver model does not affect the results much.
  - Lance: Driver & receiver C_comp can be different
  - Mike: We can have separate I and O models using [Model Selector]
    - Can [Submodel] automate the driver/receiver C_comp difference?
    - Bob: [Submodel] has no C_comp
- David: Has Guan seen the related presentation by David & Roy?
  - Very detailed on definitions of measurements
  - David will send this to Guan
- David: suggest changing ((Test-Simulate)/Test) to ((Simulate-Test)/Test)
- Guan: Reports are formatted into a spreadsheet with pictures.
- Anders: There is a scope bandwidth issue that must be considered.

AR: David send David & Roy correlation presentation to Guan

- Next week we will discuss the golden waveform and overshoot/undershoot
  issues brought up in this meeting but not discussed.
- David suggested discussing and comparing in the April 15 meeting:
  - Presentations from Guan
  - Presentation from David & Roy
  - IQ specification section 7 text

Next meeting:

08 Apr 2008 11-12 AM EST (8-9 AM PST)

Meeting ended at 12:09 PM Eastern Time.